"Ageing effects on power RF LDMOS reliability using the Transmission Line ..."

Ahmed Aldabbagh, Alistair Duffy (2015)

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DOI: 10.1109/EMCCOMPO.2015.7358349

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-13

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Ahmed Aldabbagh, Alistair Duffy:
Ageing effects on power RF LDMOS reliability using the Transmission Line Matrix method. EMC Compo 2015: 157-162

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