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"Atomic Force Microscope Characterization of the Bending Stiffness and ..."
Ti'Air E. Riggins, Wen Li, Erin K. Purcell (2022)
- Ti'Air E. Riggins, Wen Li, Erin K. Purcell:
Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes. EMBC 2022: 2348-2352
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