"Leakage Current Measurements of Amorphous Silicon Carbide Encapsulation ..."

Christopher K. Nguyen et al. (2024)

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DOI: 10.1109/EMBC53108.2024.10782884

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-08

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Christopher K. Nguyen, Alexandra Joshi-Imre, Sandeep Negi, Stuart F. Cogan:
Leakage Current Measurements of Amorphous Silicon Carbide Encapsulation for Implantable Microelectrode Arrays. EMBC 2024: 1-4

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