"Supervised segmentation of microelectrode recording artifacts using power ..."

Eduard Bakstein et al. (2015)

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DOI: 10.1109/EMBC.2015.7318661

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Eduard Bakstein, Jakub Schneider, Tomás Sieger, Daniel Novák, Jirí Wild, Robert Jech:
Supervised segmentation of microelectrode recording artifacts using power spectral density. EMBC 2015: 1524-1527

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