"Multiple-field approach for aberration correction in miniature imaging ..."

Eric Logean et al. (2013)

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DOI: 10.1117/12.2004390

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-02

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Eric Logean, Toralf Scharf, Nicolas Bongard, Hans Peter Herzig, Markus Rossi:
Multiple-field approach for aberration correction in miniature imaging systems based on wafer-level production. Multimedia Content and Mobile Devices 2013: 86671E

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