"Fitting analytical BRDF models to low-resolution measurements of light ..."

Ni Yan et al. (2016)

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DOI: 10.2352/ISSN.2470-1173.2016.9.MMRMA-370

access: open

type: Conference or Workshop Paper

metadata version: 2023-07-27

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  dblp key:
  - conf/ei-maap/YanBSA16
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  - https://dblp.org/rec/conf/ei-maap/YanBSA16
Ni Yan, Teun Baar, Maria V. Ortiz Segovia, Jan P. Allebach:
Fitting analytical BRDF models to low-resolution measurements of light scattered from relief printing samples. Measuring, Modeling, and Reproducing Material Appearance 2016: 1-6

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