"High-Quality Parallel Depth-of-Field Using Line Samples."

Stanley Tzeng et al. (2012)

> Home

Details and statistics

DOI: 10.2312/EGGH/HPG12/023-031

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

- view
  authority control:
- export record
  dblp key:
  - conf/egh/TzengPDEMO12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/egh/TzengPDEMO12
Stanley Tzeng, Anjul Patney, Andrew A. Davidson, Mohamed S. Ebeida, Scott A. Mitchell, John D. Owens:
High-Quality Parallel Depth-of-Field Using Line Samples. High Performance Graphics 2012: 23-31

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.