"Measurement Method for the Dynamic On-State Resistance of GaN Semiconductors."

Michal Sír, Ivan Feno (2018)

> Home

Details and statistics

DOI: 10.1109/EECS.2018.00106

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/eecs/SirF18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/eecs/SirF18
Michal Sír, Ivan Feno:
Measurement Method for the Dynamic On-State Resistance of GaN Semiconductors. EECS 2018: 543-546

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.