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"3D-Printed Optics for Wafer-Scale Probing."

Mareike Trappen et al. (2018)

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DOI: 10.1109/ECOC.2018.8535123

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-17

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  dblp key:
  - conf/ecoc/TrappenBDHXBFK18
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  - https://dblp.org/rec/conf/ecoc/TrappenBDHXBFK18
Mareike Trappen, Matthias Blaicher, Philipp-Immanuel Dietrich, Tobias Hoose, Yilin Xu, Muhammad Rodlin Billah, Wolfgang Freude, Christian Koos:
3D-Printed Optics for Wafer-Scale Probing. ECOC 2018: 1-3

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