"3D-Printed Optics for Wafer-Scale Probing."

Mareike Trappen et al. (2018)

> Home

Details and statistics

DOI: 10.1109/ECOC.2018.8535123

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ecoc/TrappenBDHXBFK18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ecoc/TrappenBDHXBFK18
Mareike Trappen, Matthias Blaicher, Philipp-Immanuel Dietrich, Tobias Hoose, Yilin Xu, Muhammad Rodlin Billah, Wolfgang Freude, Christian Koos:
3D-Printed Optics for Wafer-Scale Probing. ECOC 2018: 1-3

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.