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"SAT-based ATPG testing of inter- and intra-gate bridging faults."
Toru Nakura et al. (2009)
- Toru Nakura, Yutaro Tatemura, Görschwin Fey, Makoto Ikeda, Satoshi Komatsu, Kunihiro Asada:
SAT-based ATPG testing of inter- and intra-gate bridging faults. ECCTD 2009: 643-646
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