"On-chip spectral test for high-speed ADCs by ΣΔ technique."

Shakeel Ahmad, Jerzy J. Dabrowski (2011)

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DOI: 10.1109/ECCTD.2011.6043630

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Shakeel Ahmad, Jerzy J. Dabrowski:
On-chip spectral test for high-speed ADCs by ΣΔ technique. ECCTD 2011: 661-664

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