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"A Novel Method for Detection of Covered Conductor Faults by PD-Pattern ..."

Tomas Vantuch, Tomas Burianek, Stanislav Misák (2015)

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DOI: 10.1007/978-3-319-21206-7_12

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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  dblp key:
  - conf/ecc/VantuchBM15
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Tomas Vantuch, Tomas Burianek, Stanislav Misák:
A Novel Method for Detection of Covered Conductor Faults by PD-Pattern Evaluation. ECC 2015: 133-142

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