"Yield Modeling for Error Tolerant and Partially Defect Tolerant Arrays."

Vladimir M. Ciric, Vladimir Simic, Ivan Z. Milentijevic (2012)

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DOI: 10.1109/ECBS.2012.50

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Vladimir M. Ciric, Vladimir Simic, Ivan Z. Milentijevic:
Yield Modeling for Error Tolerant and Partially Defect Tolerant Arrays. ECBS 2012: 182-187

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