"Modeling avalanche breakdown for ESD diodes in integrated circuits."

Camillo Stefanucci et al. (2015)

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DOI: 10.1109/DTIS.2015.7127372

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Camillo Stefanucci, Pietro Buccella, Maher Kayal, Jean-Michel Sallese:
Modeling avalanche breakdown for ESD diodes in integrated circuits. DTIS 2015: 1-3

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