"Measurement-based analysis of fault and error sensitivities of dynamic memory."

Keun Soo Yim, Zbigniew Kalbarczyk, Ravishankar K. Iyer (2010)

Details and statistics

DOI: 10.1109/DSN.2010.5544287

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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