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"On the Estimation of Complex Circuits Functional Failure Rate by Machine ..."

Thomas Lange et al. (2019)

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DOI: 10.1109/DSN-S.2019.00021

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
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Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone:
On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques. DSN (Supplements) 2019: 35-41

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