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"Test Generation Approach for Post-Silicon Validation of High End ..."
Satish Kumar Sadasivam, Sangram Alapati, Varun Mallikarjunan (2012)
- Satish Kumar Sadasivam, Sangram Alapati, Varun Mallikarjunan:
Test Generation Approach for Post-Silicon Validation of High End Microprocessor. DSD 2012: 830-836
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