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"Hierarchical Identification of Untestable Faults in Sequential Circuits."

Jaan Raik et al. (2007)

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DOI: 10.1109/DSD.2007.4341539

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  dblp key:
  - conf/dsd/RaikUKK07
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  - https://dblp.org/rec/conf/dsd/RaikUKK07
Jaan Raik, Raimund Ubar, Anna Krivenko, Margus Kruus:
Hierarchical Identification of Untestable Faults in Sequential Circuits. DSD 2007: 668-671

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