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"Implementation-Independent Test Generation for a Large Class of Faults in ..."

Maksim Jenihhin et al. (2021)

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DOI: 10.1109/DSD53832.2021.00090

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-15

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  - conf/dsd/JenihhinORU21
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Maksim Jenihhin, Adeboye Stephen Oyeniran, Jaan Raik, Raimund Ubar:
Implementation-Independent Test Generation for a Large Class of Faults in RISC Processor Modules. DSD 2021: 557-561

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