"Weak Feature Defect Generation with GAN for Faster RCNN Based PCB Defect ..."

Chao Li, Wuhao Xia, Zhengliang Jiang (2023)

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DOI: 10.1109/DSC59305.2023.00051

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-09

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Chao Li, Wuhao Xia, Zhengliang Jiang:
Weak Feature Defect Generation with GAN for Faster RCNN Based PCB Defect Detection. DSC 2023: 306-312

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