"The test process date based quality defect detection strategy for ..."

Taichun Qin et al. (2020)

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DOI: 10.1109/DSA51864.2020.00093

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-02

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Taichun Qin, Shouwen Liu, Shouqing Huang, Yuege Zhou:
The test process date based quality defect detection strategy for spacecraft components. DSA 2020: 550-554

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