"Parametric Software Defect Patterns Based on Test Perspective."

Gu Bin-Bing, Li Yin, Ting-Ting Jiang (2020)

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DOI: 10.1109/DSA51864.2020.00065

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-12

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Gu Bin-Bing, Li Yin, Ting-Ting Jiang:
Parametric Software Defect Patterns Based on Test Perspective. DSA 2020: 364-370

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