"Investigation of Self-Heating in ZnO Thin-Film Transistors by In-Situ Gate ..."

Nicholas M. Fata et al. (2024)

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DOI: 10.1109/DRC61706.2024.10605458

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-16

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Nicholas M. Fata, Yue Ma, Sigurd Wagner, Naveen Verma, James C. Sturm:
Investigation of Self-Heating in ZnO Thin-Film Transistors by In-Situ Gate Resistance Measurement and Effect on Device Mobility Extraction. DRC 2024: 1-2

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