"Alleviation of Short Channel Effects in Ge Negative Capacitance pFinFETs."

Wonil Chung, Mengwei Si, Peide D. Ye (2018)

> Home

Details and statistics

DOI: 10.1109/DRC.2018.8442247

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/drc/ChungSY18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/drc/ChungSY18
Wonil Chung, Mengwei Si, Peide D. Ye:
Alleviation of Short Channel Effects in Ge Negative Capacitance pFinFETs. DRC 2018: 1-2

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.