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"Determining Thin Film Characteristics by Prism Coupling Technique."
Paulo Lourenço et al. (2024)
- Paulo Lourenço, Yuri Vygranenko, João Costa, Miguel Fernandes, Alessandro Fantoni, Manuela Vieira, G. Lavareda:
Determining Thin Film Characteristics by Prism Coupling Technique. DoCEIS 2024: 337-347
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