"Classification method for defect images based on association and clustering."

Iivari Kunttu et al. (2003)

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DOI: 10.1117/12.486007

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Iivari Kunttu, Leena Lepistö, Juhani Rauhamaa, Ari Visa:
Classification method for defect images based on association and clustering. Data Mining and Knowledge Discovery: Theory, Tools, and Technology 2003: 19-27

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