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"Reliability Estimation Model of ICs Interconnect Based on Uniform ..."

Tianxu Zhao et al. (2003)

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DOI: 10.1109/DFTVS.2003.1250090

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/dft/ZhaoDHM03
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  persistent URL:
  - https://dblp.org/rec/conf/dft/ZhaoDHM03
Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma:
Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. DFT 2003: 11-17

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