"The effect of spot defects on the parametric yield of long interconnection ..."

Israel A. Wagner, Israel Koren (1995)

> Home

Details and statistics

DOI: 10.1109/DFTVS.1995.476936

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/dft/WagnerK95
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/WagnerK95
Israel A. Wagner, Israel Koren:
The effect of spot defects on the parametric yield of long interconnection lines. DFT 1995: 46-54

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.