"Specification-Driven Test Design for Analog Circuits."

Pramodchandran N. Variyam, Abhijit Chatterjee (1998)

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DOI: 10.1109/DFTVS.1998.732183

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Pramodchandran N. Variyam, Abhijit Chatterjee:
Specification-Driven Test Design for Analog Circuits. DFT 1998: 335-340

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