"Test Generation and Diagnostic Test Generation for Open Faults with ..."

Hiroshi Takahashi et al. (2007)

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DOI: 10.1109/DFT.2007.11

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume:
Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. DFT 2007: 243-251

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