"Analysis of Proton-induced Single Event Effect in the On-Chip Memory of ..."

Corrado De Sio et al. (2022)

> Home

Details and statistics

DOI: 10.1109/DFT56152.2022.9962341

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dft/SioASC22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/SioASC22
Corrado De Sio, Sarah Azimi, Luca Sterpone, David Merodio Codinachs:
Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Process. DFT 2022: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.