"An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data ..."

Geewhun Seok et al. (2006)

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DOI: 10.1109/DFT.2006.14

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Geewhun Seok, Il-soo Lee, Tony Ambler, Baxter F. Womack:
An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint. DFT 2006: 145-156

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