"Characterization of CMOS Defects using Transient Signal Analysis."

James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan (1998)

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DOI: 10.1109/DFTVS.1998.732155

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/PlusquellicCL98
James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan:
Characterization of CMOS Defects using Transient Signal Analysis. DFT 1998: 93-101

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