![](https://dblp.uni-trier.de./img/logo.320x120.png)
![search dblp search dblp](https://dblp.uni-trier.de./img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de./img/search.dark.16x16.png)
default search action
"Regressive Testing for System-on-Chip with Unknown-Good-Yield."
Noh-Jin Park et al. (2003)
- Noh-Jin Park, Byoungjae Jin, K. M. George, Nohpill Park, Minsu Choi:
Regressive Testing for System-on-Chip with Unknown-Good-Yield. DFT 2003: 393-400
![](https://dblp.uni-trier.de./img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.