"Defect Analysis and a New Fault Model for Multi-port SRAMs."

Pradeep Nagaraj et al. (2001)

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DOI: 10.1109/DFTVS.2001.966790

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Pradeep Nagaraj, Shambhu Upadhaya, Kamran Zarrineh, R. Dean Adams:
Defect Analysis and a New Fault Model for Multi-port SRAMs. DFT 2001: 366-374

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