"A defective level monitor of open defects in 3D ICs with a comparator of ..."

Michiya Kanda et al. (2017)

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DOI: 10.1109/DFT.2017.8244446

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Michiya Kanda, Masaki Hashizume, Hiroyuki Yotsuyanagi, Shyue-Kung Lu:
A defective level monitor of open defects in 3D ICs with a comparator of offset cancellation type. DFT 2017: 1-4

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