default search action
"Estimation of Electromigration-Aggravating Narrow Interconnects Using a ..."
Rani S. Ghaida, Payman Zarkesh-Ha (2007)
- Rani S. Ghaida, Payman Zarkesh-Ha:
Estimation of Electromigration-Aggravating Narrow Interconnects Using a Layout Sensitivity Model. DFT 2007: 59-67
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.