"Special Session: Software-Based Self-Test Generation for RISC-V - Stuck-At ..."

Tobias Faller et al. (2024)

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DOI: 10.1109/DFT63277.2024.10753557

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-02

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Tobias Faller, Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Matteo Sonza Reorda, Bernd Becker:
Special Session: Software-Based Self-Test Generation for RISC-V - Stuck-At Generation, Functional Cell-Aware Untestability, and FPGA Demonstration -. DFT 2024: 1-6

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