"A Logistic Regression Yield Model for SRAM Bit Fail Patterns."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Randall S. Collica (1993)

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DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2003-01-27

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Randall S. Collica:
A Logistic Regression Yield Model for SRAM Bit Fail Patterns. DFT 1993: 127-135

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