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"Low-Speed Scan Testing of Charge-Sharing Faults for CMOS Domino Circuits."
Ching-Hwa Cheng et al. (2000)
- Ching-Hwa Cheng, Jinn-Shyan Wang, Shih-Chieh Chang, Wen-Ben Jone:
Low-Speed Scan Testing of Charge-Sharing Faults for CMOS Domino Circuits. DFT 2000: 329-337
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