"Monitoring Methodology for TID Damaging of SDRAM Devices based on ..."

Stefano Bertazzoni et al. (2004)

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DOI: 10.1109/DFT.2004.40

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Stefano Bertazzoni, Domenico Di Giovenale, Marcello Salmeri, Arianna Mencattini, Adelio Salsano, M. Florean, Jeffery Wyss, Ricardo Rando, Silvano Lora:
Monitoring Methodology for TID Damaging of SDRAM Devices based on Retention Time Analysis. DFT 2004: 106-110

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