"Scan-Based BIST Diagnosis Using an Embedded Processor."

Kedarnath J. Balakrishnan, Nur A. Touba (2003)

> Home

Details and statistics

DOI: 10.1109/DFTVS.2003.1250114

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/dft/BalakrishnanT03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/BalakrishnanT03
Kedarnath J. Balakrishnan, Nur A. Touba:
Scan-Based BIST Diagnosis Using an Embedded Processor. DFT 2003: 209-216

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.