"Reusing the IEEE 1500 design for test infrastructure for security ..."

Jerry Backer, David Hély, Ramesh Karri (2014)

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DOI: 10.1109/DFT.2014.6962098

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jerry Backer, David Hély, Ramesh Karri:
Reusing the IEEE 1500 design for test infrastructure for security monitoring of Systems-on-Chip. DFT 2014: 52-56

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