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"Reusing the IEEE 1500 design for test infrastructure for security ..."
Jerry Backer, David Hély, Ramesh Karri (2014)
- Jerry Backer, David Hély
, Ramesh Karri
:
Reusing the IEEE 1500 design for test infrastructure for security monitoring of Systems-on-Chip. DFT 2014: 52-56
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