"A Prevenient Voltage Stress Test Method for High Density Memory."

Jongsoo Yim et al. (2008)

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DOI: 10.1109/DELTA.2008.93

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/delta/YimKNSLLKKLK08
Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang:
A Prevenient Voltage Stress Test Method for High Density Memory. DELTA 2008: 516-520

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