"A Method for Storing Fail Bit Maps in Burn-in Memory Testers."

Atsumu Iseno, Yukihiro Iguchi (2002)

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DOI: 10.1109/DELTA.2002.994603

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Atsumu Iseno, Yukihiro Iguchi:
A Method for Storing Fail Bit Maps in Burn-in Memory Testers. DELTA 2002: 142-148

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