"A scalable technique to identify true critical paths in sequential circuits."

Raimund Ubar et al. (2017)

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DOI: 10.1109/DDECS.2017.7934568

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  - conf/ddecs/UbarKJR17
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Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik:
A scalable technique to identify true critical paths in sequential circuits. DDECS 2017: 152-157

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