"Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing."

Yiorgos Sfikas, Yiorgos Tsiatouhas (2009)

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DOI: 10.1109/DDECS.2009.5012108

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yiorgos Sfikas, Yiorgos Tsiatouhas:
Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing. DDECS 2009: 108-113

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