"Analysis of Noise Margins Due to Device Parameter Variations in Sub-100nm ..."

Zhicheng Liang, Makoto Ikeda, Kunihiro Asada (2007)

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DOI: 10.1109/DDECS.2007.4295258

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Zhicheng Liang, Makoto Ikeda, Kunihiro Asada:
Analysis of Noise Margins Due to Device Parameter Variations in Sub-100nm CMOS Technology. DDECS 2007: 81-86

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