"Device-Aware Test for Back-Hopping Defects in STT-MRAMs."

Sicong Yuan et al. (2023)

> Home

Details and statistics

DOI: 10.23919/DATE56975.2023.10137071

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/date/YuanTFXMKRCH23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/YuanTFXMKRCH23
Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui:
Device-Aware Test for Back-Hopping Defects in STT-MRAMs. DATE 2023: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.