"Scan based methodology for reliable state retention power gating designs."

Sheng Yang et al. (2010)

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DOI: 10.1109/DATE.2010.5457233

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-15

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Sheng Yang, Bashir M. Al-Hashimi, David Flynn, S. Saqib Khursheed:
Scan based methodology for reliable state retention power gating designs. DATE 2010: 69-74

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